What is the difference between the temperature uniformity and temperature deviation of the high and low temperature test box

The products of high and low temperature test chambers have the characteristics of simulating the temperature change in the atmospheric environment. It is mainly used for electrical, electronic products, and their components and other materials to be transported under high temperature and low temperature integrated environments. For product design, improvement, identification and inspection.
Temperature fluctuation: This indicator is also called temperature stability. After controlling the temperature stability, the difference between high and low temperature at any point in the working space within a given arbitrary time interval.
There is a small difference here. The "working space" is not a "studio", it is a space where the studio removes about 1/10 of the length of each side of the box wall. This indicator evaluates the control technology of the product.
Temperature range: refers to the extreme temperature that the product studio can withstand and / or reach. Usually contains the concept of constant control, which should be an extreme value that can run stably for a relatively long time.
The general temperature range of the high and low temperature test box includes extreme high temperature and extreme low temperature. The general standard requires that the index is ≤1 ℃ or ± 0.5 ℃.
Temperature uniformity: The old standard is called uniformity, and the new standard is called gradient. After the temperature is stable, the difference between the average temperature of any two points in the working space at any time interval is a large value.
This indicator can evaluate the core technology of the product more than the following temperature deviation index, so many companies' samples and solutions deliberately hide this item. The general standard requires that the index is ≤2 ℃
Temperature deviation: After the temperature is stable, the difference between the average temperature of the center of the working space and the average temperature of other points in the working space at any time interval.
Although the new and old standards of the high and low temperature test chambers have the same definition and name for this indicator, the test has changed. The new standard is more practical and harsher, but the evaluation time is shorter. The general standard requires an index of ± 2 ° C. Pure high-temperature test chambers above 200 ° C can be required according to the actual use temperature of Celsius (° C) ± 2%.
Qinzhuo's new generation of high and low temperature test chambers have temperature uniformity ≤ ± 1.0 ° C, temperature deviation ≤ ± 1.5 ° C, temperature fluctuation ≤ ± 0.5 ° C, which is higher than national standards and is more suitable for reliability testing of products such as electronic point labor.

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